0_5802 Electron Back Scattered Diffraction (EBSD) is a powerful technique based on scanning electron microscope (SEM) that in the last years has gained increased attention in the field of metallurgy. EBSD provides detailed information about the crystallographic nature of the sample at the point at which the electron beam strikes the sample surface and can be employed to study several aspects of the materials such as their crystal lattice related features, providing outputs on phases, crystal orientation and textures, misalignment at boundaries of grains and cells, lattice distortion and local strains. This presentation provides an overview about some of these applications on different metallic alloys. In particular, the discussion will be focused on three topics: the determination of grain sizes and texture for an additively manufactured Al-Mg alloy, the evolution of high- and low-angle grain boundaries in a wire-drawn AlSi5 alloy, subsequently subjected to heat treatment, and the analysis of the local crystal lattice orientation gradient with associated plastic strain and building direction, in an additively manufactured AlSi10Mg alloy after fracture toughness test.